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How to Become a User
Important Links
User Policies
Internal User Application
External User Application
User Fees Schedules
NanoFab Printable Brochure
SEM-FIB-Ebeam Writer Application
Equipment Contacts
Equipment Reservation and Status
Nano-MEMS Ph.D. Diagnostic Exam Information
 
HP 4061A Test Station

  • Fully-automated with switching controller for current-voltage and capacitance-voltage scans
  • Shielded micromanipulator probe station for ultra low-noise measurements
  • Signatone shielded probe station with temperature-controlled chuck for high temperature scans
  • Vacuum chuck probe station for low-temperature measurements
All Characterization Facilities
• Dimension 5000 AFM
• Electrical Test Station
• HP 4061A Test Station
• KLA-Tencor Alpha-Step IQ Profilometer
• Nomarski Microscope
• OCEAN OPTICS NC-UV-VIS REFLECTOMETER
• Zeiss LSM 5 Pascal Confocal Microscope
Back to All Facilities