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Jandel Four-point Probe System with RM3 Test Unit

MWP-6-SPEC Jandel Multiposition Wafer Probe Stand with

* Cylindrical four point probe head

* Compatible with wafers up to 6” in diameter

* Includes Cylindrical probe head: CYL-1.0-60-TC-60-8“
1.0 mm tip spacing

* High load – Adjustable with range of 60-150g, Factory Preset to 60g

* Tungsten carbide tips
60 micron tip radius

* Jandel RM3 Test Unit

* Constant current source and meter for use in making the four point probe measurement

* Simultaneous read-out of current and either mV or ohms-per-square

All Teaching Facilities Facilities
• Electrical Test Station - TFAB
• Gaertner Ellipsometer
• Headway Spinner
• Jandel Four-point Probe System with RM3 Test Unit
• Lindberg Oxidation Furnace
• Minibrute Diffusion Furnace
• MJB3 Karl Suss Mask Aligner
• NRC Thermal Evaporator
• Veeco FPP-5000 Four-point Probe
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