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Friday, September 20, 2013
 

Feb 2016
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Today is:
Sun, Feb 7, 2016

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11:00am
to
12:00pm
  EE Seminar: M.T. Manry  
(Lectures/Talks)

"Silicon Defect Recognition"

M.T. Manry, Professor of Electrical Engineering, UTA

Abstract:
Silicon wafers have defects which reduce the number of ICs they can yield. When these defects are found and identified, remedies can be found which increase the yield. An algorithm is presented for the recognition of four types of defects present in silicon wafer images.


Location: Nedderman Hall, Room 111
Price: free
   
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