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Wednesday, January 29, 2014
 

Oct 2014
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Today is:
Thu, Oct 30, 2014

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4:00pm
to
5:00pm
  MSE Seminar: James LeBeau  
(Lectures/Talks)

Materials Science and Engineering and Physics Seminar

"New Frontiers of Atomic Scare Characterization in the Electron Microscope"

James LeBeau, NC State University

Abstract: In this talk, Dr. LeBeau will introduce revolving scanning transmission electron microscopy (RevSTEM). The method uses a series of fast-frames. This scan rotation introduces a concomitant change in image distortion that we use to analyze the sample drift rate and direction. LeBeau will provide a theoretical basis for the approach and introduce the projective standard deviation (PSD) to quantify lattice vector angles in atomic resolution images.


Location: Science Hall Room 101
Price: free
   
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