Materials Science and Engineering and Physics Seminar
"New Frontiers of Atomic Scare Characterization in the Electron Microscope"
James LeBeau, NC State University
Abstract: In this talk, Dr. LeBeau will introduce revolving scanning transmission electron microscopy (RevSTEM). The method uses a series of fast-frames. This scan rotation introduces a concomitant change in image distortion that we use to analyze the sample drift rate and direction. LeBeau will provide a theoretical basis for the approach and introduce the projective standard deviation (PSD) to quantify lattice vector angles in atomic resolution images.