SPIE - The International Society for Optical Engineering

Microtechnologies for the New Millenium 2003

 

19–21 May 2003, Maspalomas, Gran Canaria, Canary Islands, Spain

 

 

Smart Sensors, Actuators, and MEMS



Conference 5116
Monday 19-Wednesday 21 May 2003
Proceedings of SPIE Vol. #5116

 

Conference Chair: Jung-Chih Chiao, Univ. of Texas/Arlington (USA)

Conference Co-chairs: Vijay K. Varadan, The Pennsylvania State Univ. (USA); Carles Cané, Ctr. Nacional de Microelectrónica (Spain)

Program Committee: Joan Bausells, Ctr. Nacional de Microelectrónica (Spain); Jin-Chern Chiou, National Chiao Tung Univ. (Taiwan); Nico F. de Rooij, Univ. de Neuchatel (Switzerland); Masayoshi Esashi, Tohoku Univ. (Japan); Carles Ferrer, Ctr. Nacional de Microelectrónica (Spain); Hiroyuki Fujita, Univ. of Tokyo (Japan); Kazuhiro Hane, Tohoku Univ. (Japan); Klas Hjort, Uppsala Univ. (Sweden); Wensyang Hsu, National Chiao Tung Univ. (Taiwan); Jerome F. Jakubczak, Sandia National Labs. (USA); Chantal G. Khan Malek, Univ. Paris-Sud (France); Meng-Hsiung Kiang, Consultant (USA); Eun S. Kim, Univ. of Southern California (USA); Jeong-Bong Lee, Univ. of Texas/Dallas (USA); Lih-Yuan Lin, Consultant (USA); Liwei Lin, Univ. of California/Berkeley (USA); Michael J. Little, Solus Micro Technologies, Inc. (USA); Victor M. Lubecke, Lucent Technologies/Bell Labs. (USA); Dean P. Neikirk, Univ. of Texas/Austin (USA); M. Ash Parameswaran, Simon Fraser Univ. (Canada); Hans Siegenthaler, Univ. Bern (Switzerland); Michael Sinclair, Microsoft Corp. (USA); Roland Zengerle, Albert-Ludwigs-Univ. (Germany)

Monday 19 May

Welcome and Opening Remarks Mon. 8.30 to 9.00
Plenary Presentation Mon. 9.00 to 10.00

Photons and Dollars: The Economic Challenge of the Internet

Ira Deyhimy, Vitesse Semiconductor Corp. (USA)

SESSION 1 to run parallel with SESSION 2

SESSION 1 Mon. 10.15 to 12.55

Materials

SOI-silicon as structural layer for NEMS applications, M. Villarroya, Univ. Autònoma de Barcelona (Spain); E. Figueras, F. Perez-Murano, F. Campabadal, J. Esteve, Ctr. Nacional de Microelectrónica (Spain); N. Barniol, Univ. Autònoma de Barcelona (Spain) [5116-01]

Fabrication and characterization of multi-layered SOI for MEMS applications, K. Somasundram, D. Cole, C. McNamara, A. Boyle, P. McCann, C. Devine, A. Nevin, Analog Devices Belfast Ltd. (United Kingdom) [5116-02]

Microstructuring of PYREX glass and polymers by excimer laser, B. Keiper, H. Exner, R. Ebert, U. Löschner, Laserinstitut Mittelsachsen e.V. (Germany) [5116-03]

Stereolithography of lead zirconate titanate ceramics for MEMS applications, D. Olivier, H. Le Gall, S. Corbel, Groupe ENSIC-Nancy (France) [5116-04]

Fabrication of micromachined TiNi based microgripper with complaint structure, Y. Fu, H. Du, Nanyang Technological Univ. (Singapore) [5116-05]

Electroactive characteristics of hydrogels composed of poly(vinyl alcohol) and poly(N-isopropylacrylamide), S. J. Kim, S. J. Park, S. I. Kim, I. Y. Kim, Y. M. Lee, Hanyang Univ. (South Korea); H. C. Kim, Seoul National Univ. (South Korea); T. D. Chung, Sungshin Women's Univ. (South Korea) [5116-06]

Surface microstructuring of biocompatible bone analogue material HAPEX using LIGA technique and embossing, A. Schneider, E. Huq, Rutherford Appleton Lab. (United Kingdom); S. Rea, W. Bonfield, Univ. of Cambridge (United Kingdom) [5116-07]

Modified sol-gel derived PZT ceramics, A. M. Amer, Suez Univ. (Egypt) [5116-08]

Lunch Break

SESSION 2 Mon. 10.15 to 12.55

Sensors I

Smart sensors development based on a distributed bus for microsystems applications, C. Ferrer, Ctr. Nacional de Microelectrónica (Spain) and Univ. Autònoma de Barcelona (Spain); B. Lorente, Univ. Autònoma de Barcelona (Spain) and Ctr. Nacional de Microelectrónica (Spain) [5116-09]

Low-temperature InOx thin films for O3 and NO2 gas sensing, G. Kiriakidis, H. Ouacha, Foundation for Research and Technology (Greece) [5116-10]

Design fabrication and test of micromachined silicon capacitive gas sensors with integrated read-out, J. Amírola-Sanz, A. Rodiguez, L. Castaner, Univ. Politècnica de Catalunya (Spain) [5116-11]

Novel strain sensors based on magnetostrictive magnetic tunneling junctions, M. Loehndorf, CAESAR (Germany); J. Wecker, M. Rüehrig, Siemens AG (Germany); E. Quandt, CAESAR (Germany) [5116-12]

Multimode torsional micro-oscillators and micromagnets for NMR force microscopy, J. T. Markert, Y. J. Lee, T. C. Messina, C. W. Miller, U. M. Mirsaidov, Univ. of Texas/ Austin (USA) [5116-13]

Hybrid neural networks for ISFET source separation, S. Bermejo, G. Bedoya, J. Cabestany, Univ. Politècnica de Catalunya (Spain) [5116-14]

Compatibility of gas and flow sensor technology fabrication, N. Sabate, I. Gràcia, C. Cane, Nacional de Microelectrónica (Spain); J. Puigcorbé, J. Cerdà, J. R. Morante, Univ. de Barcelona (Spain); J. Berganzo, IKERLAN (Spain) [5116-15]

Pencil probe system for electrochemical analysis and modification in nanometer dimension, R. J. Fasching, Y. Tao, K. Hammerick, F. B. Prinz, Stanford Univ. (USA) [5116-16]

Lunch Break

SESSION 3 to run parallel with SESSION 4

SESSION 3 Mon. 14.15 to 17.20

MEMS I

Overview of MEMS/NEMS technology development for space applications at NASA/JPL (Invited Paper), T. George, Jet Propulsion Lab. (USA) [5116-17]

Adhesive wafer bonding for MEMS applications, V. Dragoi, T. Glinsner, G. Mittendorfer, EV Group E. Thallner GmbH (Austria); B. Wieder, EV Group Inc. (USA); P. Lindner, EV Group E. Thallner GmbH (Austria) [5116-18]

Silicon nanolayer transfer, A. Usenko, Silicon Wafer Technologies (USA); W. Carr, New Jersey Institute of Technology (USA) [5116-19]

Power consumption in microvalves design, T. Hsu, San Jose State Univ. (USA) and Univ. of Illinois (USA) [5116-20]

Micromolding with surface engineered metallic inserts, W. J. Meng, Louisiana State Univ. (USA) [5116-21]

High-performance polysilicon air-gap thin film transistor on low-temperature substrates, H. M. Kotb, A. Salaün, M. Tayeb, B. Olivier, Univ. de Rennes 1 (France) [5116-22]

Soft lithographic patterning of oxide thin films, E. Abad, Tekniker (Spain) and Cranfield Univ. (United Kingdom); R. W. Whatmore, Q. Zhang, Z. Huang, Cranfield Univ. (United Kingdom) [5116-23]

Observability, exact controllability, and stabilization of piezoelectric medium coupled to electronic systems, G. Senouci-Bereksi, Ctr. of Advanced European Studies and Research (Germany); A. Benchaib, Univ. de Mostaganem (Algeria) [5116-24]

SESSION 4 Mon. 14.15 to 17.20

Actuators I

Optical components and actuators for integrated near-field optical data storage (Invited Paper), K. Hane, Y. Kanamori, Tohoku Univ. (Japan) [5116-25]

Integrated near-field optical head for hybrid recording, Y. Chiu, M. Wu, H. D. Shieh, Y. T. Sun, H. Chou, W. Hsu, National Chiao Tung Univ. (Taiwan) [5116-26]

Optomechanical cycles of photochromic-polymer microsystems induced by laser irradiation, A. Athanassiou, M. Kalyva, K. Lakiotaki, C. Fotakis, Foundation for Research and Technology-Hellas (Greece) [5116-27]

Classical holography and opto-digital holography applied to testing of microsystems: a comparative study, V. D. Petrov, Holographic Lab. (Germany) [5116-28]

Smart tong grippers for micro parts, J. Schlick, D. Zuehlke, Univ. Kaiserslautern (Germany) [5116-29]

Shell-type micromechanical oscillator, M. Zalalutdinov, K. Aubin, Cornell Univ. (USA); B. H. Houston, Naval Research Lab. (USA); A. T. Zehnder, B. Ilic, D. Czaplewski, H. G. Craighead, J. M. Parpia, Cornell Univ. (USA) [5116-30]

Knitted strain gauges, R. Wijesiriwardana, T. Dias, S. Mukhopadhyay, Univ. of Manchester Institute of Science and Technology (United Kingdom) [5116-31]

Analysis of a piezoelectric-driven hydraulic poppet valve, R. Nunez-Lopez, Univ. of Sheffield (United Kingdom); W. A. Bullough, Univ. of Sheffield (United Kingdom) and Journal of Intelligent Materials and Structures (USA) and Journal of Applied Mechanics and Engineering (United Kingdom); S. B. Chin, Univ. of Sheffield (United Kingdom) [5116-32]

Tuesday 20 May

Plenary Presentation Tues. 8.30 to 9.30

IC Technology Trends for Wireless Local Area Networks

Neil Weste, Cisco Systems, Inc. (Australia)

SESSION 5 to run parallel with SESSION 6

SESSION 5 Tues. 9.45 to 12.55

Actuators II

Folded and tapered-beam thermal actuator (Invited Paper), M. J. Sinclair, Microsoft Corp. (USA); K. Wang, Univ. of Washington (USA) [5116-33]

Evaluation of mechanical properties of polysilicon by comb-finger actuation, R. Cambie, F. Carli, C. Combi, Univ. degli Studi di Pavia (Italy) [5116-34]

Smart electrostrictive composite materials for actuators, N. Yu, Yuan-Ze Univ. (Taiwan) [5116-35]

Electronic circuitry development in a micropyrotechnic system for micropropulsion applications, M. Puig-Vidal, J. Lopez-Sanchez, P. L. Miribel-Catala, E. Montane-Borras, J. M. Lopez-Villegas, J. Samitier-Marti, Univ. de Barcelona (Spain); C. Rossi, T. Camps, M. Dumonteuil, CNRS (France) [5116-36]

Sigma-delta microsystems for readout and servo control, N. Delorme, C. Condemine, LETI-CEA (France); D. Barbier, INSA Lyon (France) [5116-37]

Brass microfabricated pump with a built in magnetic driver, R. M. Atta, Univ. of Southampton (United Kingdom) [5116-38]

Laser beam micro forming as a new adjustment technology using dedicated actuator structures, A. M. Olowinsky, L. Bosse, Fraunhofer-Institut für Lasertechnik (Germany) [5116-39]

Design and fabrication of a three-dimensional long-stretch micro drive by electroplating, C. Wu, W. Tai, W. Hsu, National Chiao Tung Univ. (Taiwan) [5116-40]

Modeling and simulation for electrostatically driven microactuator, T. Ha, O. Kwon, J. Kim, T. Won, Inha Univ. (South Korea) [5116-41]

Lunch Break

SESSION 6 Tues. 9.45 to 12.35

Sensors II

Development of microbead size selection chip for a chemical array sensor (Invited Paper), D. Neikirk, B. H. Park, Y. S. Park, Univ. of Texas/Austin (USA) [5116-42]

Polymeric mechanical sensors with piezoresistive readout integrated in a microfluidic system, M. Calleja, P. A. Rasmussen, A. Johansson, A. Boisen, Danmarks Tekniske Univ. (Denmark) [5116-43]

Compact and smart laser diode systems for cancer treatment, V. N. Svirin, POLYUS Research and Development Institute (Russia); V. V. Sokolov, P.A. Hertzen Moscow Research Oncology Institute (Russia); T. I. Solovieva, POLYUS Research and Development Institute (Russia) [5116-44]

Fluidics technology: a source of new possibilities for the new millennium, N. F. Macia, Arizona State Univ. (USA) [5116-45]

Long periodic grating in multimode fiber for measuring traces of chromium in water, P. Suresh Kumar, C. P. Vallabhan, V. P. Nampoori, P. Radhakrishnan, Cochin Univ. of Science and Technology (India) [5116-46]

Metallophthalocyanine blend polymeric films-based ammonia gas sensor, S. D. Chakane, R. D. Kankaria, BJS College Wagholi (India) [5116-47]

Resonating cantilever mass sensor with on-plane excitation, J. Teva, G. Abadal, Univ. Autònoma de Barcelona (Spain); X. Jordà, Ctr. Nacional de Microelectrónica (Spain); N. Barniol, Univ. Autònoma de Barcelona (Spain) [5116-48]

Simulation of bulk micromachined vibration sensor with low noise, J. Zhu, Southeast Univ. (China); X. Liu, M. Huo, W. Chen, Q. Chen, Harbin Institute of Technology (China) [5116-49]

Lunch Break

SESSION 7 to run parallel with SESSION 8

SESSION 7 Tues. 14.15 to 17.20

MEMS II

Nano-bending method to quantify the residual stress of MEMS structure (Invited Paper), J. Kim, J. Kim, Seoul National Univ. (South Korea); J. Hahn, Korea Research Institute of Standards and Science (South Korea); Y. Kim, Seoul National Univ. (South Korea) [5116-50]

Laser bending of silicon microstructures, H. Exner, U. Löschner, Laserinstitut Mittelsachsen e.V. (Germany) [5116-51]

Rapid prototyping and structure generation using three-dimensional nanolithography with electron beam induced chemical reactions, H. W. Koops, NaWoTec GmbH (Germany) [5116-52]

Fabrication and characterization of nano-interdigitated electrodes, N. F. de Rooij, Univ. de Neuchatel (Switzerland) [5116-53]

Dynamic characterization of SiO2-Au microcantilevers using Michelson interferometer, G. Marinier, Univ. de Rouen (France); S. Dilhaire, L. D. Patino Lopez, Univ. Bordeaux 1 (France); M. Benzohra, Univ. de Rouen (France) [5116-54]

Experimental modal testing for microsystems, O. B. Ozdoganlar, B. D. Hansche, T. G. Carne, Sandia National Labs. (USA) [5116-55]

Characterization of SU-8 as a photoresist for electron beam lithography, A. C. Nallani, S. W. Park, J. B. Lee, Univ. of Texas/Dallas (USA) [5116-56]

Characterization of embedded root method in UV-LIGA process, C. Ho, W. Hsu, National Chiao Tung Univ. (Taiwan) [5116-57]

SESSION 8 Tues. 14.15 to 17.30

Optical Applications

Optical MEMS devices for telecom systems (Invited Paper), F. Pardo, Lucent Technologies/Bell Labs. (USA) [5116-58]

MEMS mirror array for a wavelength selective 1xN switch (Invited Paper), D. O. Lopez, Lucent Technologies/Bell Labs. (USA) [5116-59]

MEMS variable optical attenuators for volume production, V. Vaganov, N. Belov, S. R. Hout, MegaSense, Inc. (USA) [5116-60]

Monolithic III-V and hybrid polysilicon-III-V microelectromechanical tunable vertical cavity surface emitting lasers, E. M. Ochoa, J. A. Lott, Air Force Institute of Technology (USA); T. R. Nelson, Jr., Air Force Research Lab. (USA); A. Stintz, K. J. Malloy, Univ. of New Mexico (USA) [5116-61]

Back-to-back micromirror device for optical add/drop multiplexer applications, Y. Lin, J. Chiou, National Chiao Tung Univ. (Taiwan) [5116-62]

Enhancement on optical attenuation by non-smooth tunable mirror curvatures, C. Lin, W. Hsu, National Chiao Tung Univ. (Taiwan) [5116-63]

Hexagonal optical micro-pillar cavity filters: design, fabrication, and characterization, F. Tung, Hong Kong Univ. of Science and Technology (Hong Kong); N. Ma, Zhejiang Univ. (China) and Hong Kong University of Science and Technology (Hong Kong); A. W. Poon, Univ. of Chicago (USA) and Yale Univ. (USA) [5116-64]

Fabrication of a highly efficient optical modulator based on silicon-on-insulator, R. M. Atta, A. G. R. Evans, Univ. of Southampton (United Kingdom); J. C. Png, G. T. Reed, Univ. of Surrey (United Kingdom) [5116-65]

Posters -Tuesday

Poster presenters will stand by their posters from 17.30 to 19.00 to answer questions. Posters must be removed at the end of the poster session.

  • RF MEMS applications, J. Chiao, Univ. of Texas/Arlington (USA) [5116-84]
  • New method decreasing drive voltage of torsion beam actuator micromechanical optical switches, W. dong, C. Jia, X. Zhang, C. Liu, L. Zhang, J. Pan, P. Ji, W. Chen, Jilin Univ. (China) [5116-85]
  • Dynamic characterization of passive microstructures (SiO2-Au microcantilevers) under controlled environment, G. Marinier, M. Benzohra, E. Joubert, M. Ketata, Univ. de Rouen (France) [5116-86]
  • Systematic design methodology of bistable compliant micro-mechanisms, J. Tsay, National Tsing Hua Univ. (Taiwan) [5116-87]
  • VIACT cascade microactuator, R. Dabbaj, Consultant (United Kingdom) [5116-88]
  • Circular RF MEMS resonator solutions for 100-nm to 10-nm SOI structures, S. K. Myllymaki, Tampere Univ. of Technology (Finland) [5116-89]
  • Stability of diffusion equation solution using various formulation of finite difference method, M. Maachowski, Ben-Gurion Univ. of the Negev (Israel); J. Olesik, Pedagogical Univ. of Czestochowa (Poland) [5116-90]
  • Design considerations of electrostatic forces in microaccelerometers, J. Dong, Tsinghua Univ. (China); X. Wu, Carnegie Mellon Univ. (USA) [5116-91]
  • Casimir Force: an electrostatic origin, T. V. Prevenslik, Consultant (USA) [5116-92]
  • Advantages of p++ polysilicon etch stop layer vs. p++ silicon, R. Charavel, J. Raskin, Univ. Catholique de Louvain (Belgium) [5116-93]
  • Electric properties of chalcogenide semiconductor thin films, G. M. Khlyap, Pedagogical Univ. (Ukraine); V. I. Bilosertseva, National Univ. (Ukraine) [5116-94]
  • Special problems about design of a micromechanical accelerometer, Y. Liu, J. Dong, Tsinghua Univ. (China) [5116-95]
  • Characterization of mechanical properties of Ti50+xNi20-xPd30 alloy showing different phase transformation behaviors, Q. C. Tian, Baoshan Iron and Steel Co., Ltd. (China); J. S. Wu, Shanghai Jiaotong Univ. (China) [5116-96]
  • High-repetition rate current drivers for picosecond laser modules employed in high-precision laser radars and 3D vision, S. N. Vainshtein, Univ. of Oulu (Finland); V. S. Yuferev, A.F. Ioffe Physico-Technical Institute (Russia); J. T. Kostamovaara, Univ. of Oulu (Finland) [5116-97]
  • High-temperature contact-less position sensor based on giant magnetoresistive Agx-Co1-x alloy, S. Arana, E. Castaño, J. Gracia, Ctr. de Estudios e Investigaciones Técnicas (Spain) [5116-98]
  • Measurement of thermoelectric, galvanomagnetic, and thermomagnetic effects on micro-samples at ultrahigh pressure, S. V. Ovsyannikov, V. V. Shchennikov, Institute of Metal Physics (Russia) [5116-99]
  • MEMS-based transmission lines for microwave applications, J. Fu, Q. Wu, X. Gu, H. Shi, Harbin Institute of Technology (China); J. Lee, Kwangwoon Univ. (South Korea) [5116-100]
  • Design and fabrication of a PDMS-membrane based electromagnetic micropump, L. Bai, P. Zhang, Y. Wu, Changchun Institute of Optics and Fine Mechanics (China) [5116-101]
  • Novel 4-bit digital MEMS phase shifter, J. Zhu, Southeast Univ. (China) [5116-102]
  • Simpler method to fabricate buried channel optical waveguides based on porous silicon, Z. Jia, Xinjiang Univ. (China) [5116-103]
  • Electrical characterizations of smart hydrogel based on alginate/poly (diallyldimethylammonium chloride) in solutions, S. J. Kim, S. G. Yoon, I. Y. Kim, Hanyang Univ. (South Korea); Y. H. Lee, K. H. An, Sungkyunkwan Univ. (South Korea); N. G. Kim, C. U. Hong, Chonbuk National Univ. (South Korea) [5116-104]
  • Modeling new optimized geometries for a gas sensor application, M. Morata, E. Figueras, I. Gracia, L. Fonseca, C. Cané, Ctr. Nacional de Microelectrónica (Spain) [5116-105]
  • Microfluidics meets thin film electronics: a new approach towards an integrated intelligent lab-on-a-chip, H. Schäfer, S. Chemnitz, S. Schumacher, V. Koziy, A. Fischer, A. J. Meixner, D. Ehrhardt, M. Böhm, Univ. Siegen (Germany) [5116-106]
  • High-power generation with a vibratory, magnetic self-power generator based on MEMS technique, C. Lin, W. Hsu, National Chiao Tung Univ. (Taiwan) [5116-107]
  • Cost-effective mask for deep x-ray lithography, H. Scheunemann, B. Loechel, D. Schondelmaier, L. Jian, BESSY GmbH (Germany); Y. M. Desta, J. Goettert, Louisiana State Univ. (USA) [5116-108]
  • Monolithical integration of polymer-based microfluidic structures on application specific integrated circuits, S. Chemnitz, H. Schäfer, S. Schumacher, V. Koziy, A. Fischer, A. J. Meixner, D. Ehrhardt, M. Böhm, Univ. Siegen (Germany) [5116-109]
  • Semiconductor gas sensor compatibility with CMOS technologies, M. J. López-Bosque, J. A. Plaza, C. Cané, Ctr. Nacional de Microelectrónica (Spain); J. Wöllenstein, G. Kühner, Fraunhofer-Institut für Physikalische Meßtechnik (Germany) [5116-110]
  • Estimation of the performance of optical collimators manufactured by automatic assembly system, D. Choi, Korea Institute of Machinery and Materials (South Korea) [5116-111]
  • Modeling and simulation of the new design for MEMS voltage tunable capacitor, O. S. Kwon, T. S. Ha, J. W. Kim, J. S. Oh, T. Y. Won, Inha Univ. (South Korea) [5116-112]
  • Amorphous silicon thin film for all-optical micromodulator, M. A. M. Nigro, Univ. degli Studi di Reggio Calabria (Italy) and IMM - National Council of Research (Italy); F. Cantore, Univ. degli Studi di Reggio Calabria (Italy); F. G. F. della Corte, Univ. degli Studi di Reggio Calabria (Italy) and IMM-National Research Council (Italy); C. Summonte, Consiglio Nazionale delle Ricerche (Italy) [5116-113]
  • Study of the systems "thin metal film - thick lithium niobate substrate" implanted by Ar+ ions and its application for production of pyroelectric photodetectors, V. O. Lysyuk, V. S. Staschuk, L. V. Poperenko, Taras Shevchenko Kiev National Univ. (Ukraine); M. I. Kluy, Institute for Semiconductor Physics (Ukraine) [5116-114]
  • Fabrication of nitride thin films from laser plasma, B. K. Kotlyarchuk, D. I. Popovych, A. Serednytski, Institute for Applied Problems of Mechanics and Mathematics (Ukraine) [5116-115]
  • Influence of electric field on emission of high-energy electron from ITO layers, J. Olesik, Pedagogical Univ. of Czestochowa (Poland) [5116-116]
  • Novel three-axis silicon probe with integrated circuit on chip for microsystem components, P. Pornnoppadol, V. Nesterrov, U. Brand, Physikalisch-Technische Bundesanstalt (Germany); M. Schmidt, R. Wilke, S. Buettgenbach, Technische Univ. Braunschweig (Germany) [5116-117]
  • Improvement of electromechanical microscanners efficiency using modeling results, N. I. Mukhurov, Institute of Electronics (Belarus) [5116-118]
  • New micromachined VOA for improvement of the optical characteristics, S. Jung, Y. Hong, J. Lee, H. Lee, Samsung Electro-Mechanics Co., Ltd. (South Korea) [5116-119]
  • Low-loss wide band filters and resonator filters using high-temperature stable high-electromechanical coupling surface acoustic wave substrates using micro-fabrication technology, K. Yamanouchi, Tohoku Institute of Technology (Japan) [5116-120]
  • Influence of microstructure of tungsten oxide thin films on their general performance as ozon and NOx gas sensors, O. Berger, T. Hoffmann, W. Fischer, Technische Univ. Dresden (Germany); V. Melov, Fraunhofer-Institute for Nondestructive Testing (Germany) [5116-121]
  • System approach to MEMS commercialization, V. Vaganov, N. N. Belov, S. R. Hout, MegaSense, Inc. (USA) [5116-122]
  • Three-dimensional bonding technologies for MEMS, V. Vaganov, N. N. Belov, S. R. Hout, MegaSense, Inc. (USA) [5116-123]
  • Various micromachined silicon planes on (100) and (110) silicon for optical mirror applications, D. Resnik, D. Vrtacnik, U. Aljancic, M. Mozek, S. Amon, Univ. v Ljubljani (Slovenia) [5116-124]

Wednesday 21 May

Plenary Presentation Wed. 8.30 to 9.30

Photons from the Universe

Rafael Rebolo-López, Instituto de Astrofísica de Canarias (Spain)

SESSION 9 Wed. 9.45 to 12.55

RF/Integrated Circuits

Polymers in RF and millimeterwave applications (Invited Paper), K. M. Grenier, LAAS CNRS (France); V. Lubecke, Lucent Technologies/Bell Labs. (USA); F. Bouchriha, L. Rabbia, D. Dubuc, P. Pons, R. Plana, LAAS CNRS (France) [5116-66]

Infrared wavelength selective micromachined microbolometers, D. Neikirk, J. W. Kim, Univ. of Texas/Austin (USA) [5116-67]

Finline technology for millimeter wave MEMS, J. S. Fu, Y. Lu, J. Ma, Z. Shen, Nanyang Technological Univ. (Singapore) [5116-68]

Laser annealing for high-Q MEMS resonators, K. Aubin, M. Zalalutdinov, Cornell Univ. (USA); B. Houston, Naval Research Lab. (USA); A. Zehnder, J. M. Parpia, H. G. Craighead, Cornell Univ. (USA) [5116-69]

Fabrication of a three-dimensional inductor coil using excimer laser micromachining, K. I. Jolic, M. K. Ghantasala, Swinburne Univ. of Technology (Australia) [5116-70]

High-density multi-layer connection technology for MEMS and CMOS application, S. Bai, R. Fasching, F. Prinz, Stanford Univ. (USA) [5116-71]

Optically controlled microwave switch device, A. J. Viitanen, S. A. Tretyakov, Helsinki Univ. of Technology (Finland) [5116-72]

Hot electron bolometer on membranes for THZ applications, M. Salez, Observatoire de Paris (France); P. Pons, LAAS CNRS (USA); J. Baubert, Y. Delorme, Observatoire de Paris (France); G. Goltsman, Moscow State Pedagogical Univ. (Russia) [5116-73]

Submillimeter mixer based on superconductive parallel junction arrays, F. Boussaha, Observatoire de Paris (France) [5116-74]

Lunch Break

SESSION 10 Wed. 14.15 to 17.30

MEMS III

Monolithic photovoltaic minipanels using bulk micromachining techniques, S. Bermejo, P. R. Ortega, L. Castañer, Univ. Politècnica de Catalunya (Spain) [5116-75]

Stress release of PECVD oxide by RTA, R. Charavel, J. P. Raskin, Univ. Catholique de Louvain (Belgium) [5116-76]

Modeling and simulation of the geometrical effect by manufacturing tolerances for micro-electro-mechanical systems, J. W. Kim, O. S. Kwon, T. Ha, J. Oh, T. Won, Inha Univ. (South Korea) [5116-77]

Fabrication of conductive AFM probes and their evaluation for carrier mapping, M. Fouchier, P. Eyben, IMEC (Belgium); D. Alvarez, Infineon Technologies AG (Germany) and IMEC (Belgium); N. Duhayon, IMEC (Belgium); W. Vandervorst, IMEC (Belgium) and KULeuven (Belgium) [5116-78]

Characterization of front- to backwafer alignment and bulk micromachining using electrical overlay test structures, H. W. Van Zeijl, J. Slabbekoorn, Technische Univ. Delft (Netherlands) [5116-79]

Modification on surface roughness by combining dry and wet etching, C. Lee, W. Hsu, National Chiao Tung Univ. (Taiwan) [5116-80]

Matching different size mask to improve stepper throughput effectively, F. Weng, H. Hsu, C. Chang, Y. Hsiao, C. Kuo, Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) [5116-81]

Microlens design for compact lens system, H. Hsu, F. Weng, C. Chang, Y. Hsiao, Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) [5116-82]

Microfabrication using selective laser sintering micron metal powder, J. Chen, T. Zuo, Beijing Polytechnic Univ. (China) [5116-83]