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Dr. Li Zeng

Dr. Li Zeng

Education

Ph.D. Industrial Engineering,University of Wisconsin - Madison, 2009
M.S. Statistics, University of Wisconsin - Madison, 2007
M.S. Optical Engineering, Tsinghua University, China, 2004
B.S. Precision Instruments,Tsinghua University, China, 2002

Experience

2010 (Sept.) - Present Assistant Professor, The University of Texas at Arlington
2010 (Feb.) - 2010 (Aug.) Research Associate, University of Wisconsin - Madison
2004 - 2010 Research Assistant, University of Wisconsin - Madison
Full Curriculum Vitae

 

Research Interests

Dr. Zeng’s research interest is mainly on statistical modeling and analysis of complex production and service systems, with specific focus on three types of problems, i.e., performance/quality measurement, monitoring and diagnosis. The goal is to characterize baseline system performance, detect changes and identify root causes for changes. She has applied her methodologies to various complex systems including manufacturing systems such as automobile assembly processes and nanocomposite fabrication processes, and health delivery systems such as cardiac surgeries.

Professional Activities

Dr. Zeng is a member of Institute for Operations Research and the Management Sciences (INFORMS), and Institute of Industrial Engineers (IIE).

Selected Publications

  • Ding, Y., Zeng, L., and Zhou, S., 2006, "Phase I Analysis for Monitoring Nonlinear Profile Signals in Manufacturing Processes," Journal of Quality Technology, 38(3), 199-216.
  • Zeng, L., and Zhou, S., 2007, "Inferring the Interactions in Complex Manufacturing Processes Using Graphical Models," Technometrics, 49(4), 373-381.
  • Zeng, L., and Zhou, S., 2008, "Variability Monitoring of Multistage Manufacturing Processes Using Regression Adjustment Methods," IIE Transactions, 40(2), 109-121.
  • Zeng, L., Jin, N. and Zhou, S., 2008, "Multiple Fault Signature Integration and Enhancing for Variation Source Identification in Manufacturing Processes," IIE Transactions, 40(10), 919-930.
  • Zhou, Q., Zeng, L., and Zhou, S., 2008, "Statistical Monitoring of Defect Patterns Using Hough Transform," IEEE Transactions on Semiconductor Manufacturing, in press.

 

 

 

 

 

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