Nancy L. Michael, Ph.D.
Senior Lecturer, ME Undergraduate Advisor
Ph.D. University of Texas at Arlington,
M. S. M. S. E., University of Texas at Arlington
B. S. Cer. E., Iowa State University
Areas of Expertise: Electronic materials, integrated circuit interconnect technology, materials characterization, (SEM, XRD, AES, XPS).
Background: Dr. Michael has research experience in reliability of interconnects (including Cu, Al, and Low-k dielectric materials), copper and low-k dielectric integration issues, copper resistivity, and barrier effectiveness as IC feature size decreases. Dr. Michael is a member of TMS, active in symposium organizing, and her work has been published in various refereed journals as well as conference proceedings.
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