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Characterization Center for Materials and Biology

The UTA Characterization Center for Materials and Biology (C2MB) is a user facility that is available to faculty, students and researchers from UTA, other institutions and industry. The objective is to provide state-of-the-art instrumentation for use by the university research community in order to foster interdisciplinary collaboration and strengthen the research activities.

Personnel

  • Stathis Meletis, Ph.D., Chair and Director of CCMB
  • Jiechao Jiang, Ph.D., Facility Manager of CCMB

Hitachi H-9500 High-Resolution TEMFacilities and Equipment

Hitachi H-9500 High-resolution TEM
Ultra high-resolution microscope with an accelerated voltage of 300 kV; a point-to-point resolution of 0.18 nm and a lattice resolution of 0.10 nm. A SC-1000 Orius® TEM CCD Camera (4008 x 2672 pixels) is attached to the microscope allowing quick and efficient searching of areas within the sample and viewing and recording high resolution images with ease. An EDAX EDS system is also attached to the H-9500 allowing chemical analysis at the nanoscale.
JEOL 1200EX STEM
This TEM has an accelerated voltage of 120 kV and a point resolution of 0.34 nm. It is equipped with an oxford INCA EDS system for X-ray microanalysis. This microscope is suitable for microstructure characterization of biological, polymer and inorganic materials. It is also an excellent tool for TEM teaching and training.
Hitachi S-5000H cold Field Emission SEM
Hitachi S-5000H is an ultra high-resolution SEM with a cold field emission source. It has a resolution of 0.6nm at 30 kV and 3.5 nm at 1 kV in secondary electron image. The magnification is from 30 x ~ 2000 for low mag mode and from 250 x ~ 1000000 X for high mag mode. This SEM has PCI Digital Imaging software for digital image recording.
Hitachi S-3000N Variable Pressure SEM
This SEM has 3.0 nm resolution at high vacuum and 4.0 nm resolution at low vacuum. It is computer control for ultimate ease of use. Examination of insulating and biological samples is possible at low vacuum without the need of coating a conductive layer on the sample surface. This SEM is attached with an EDS system allowing chemical composition analysis and elemental mapping.
JEOL JSM 6100 SEM
This is a high-vacuum SEM equipped with an EDS system allowing general and local chemical composition analysis, and elemental mapping. This SEM provides an additional tool available when the Hitachi S-3000N SEM is overbooked.
Park XE 70 AFM
This AFM is featured with compact mechanical design and flexible sample handling. It has 50 µm ?50 µm XY scan range, 12 µm Z scan range and a manual optics stage.
Hysitron Ubi®1 Nano Indenter
This instrument has capabilities for Nanoindentation (hardness and elastic modulus); Nanoscratch (friction, wear, etc.) and SPM imaging.
Perkin-Elmer Phi 560 XPS/Auger System
Phi 560 ESCA/SAM is a multi-technique surface analysis system to meet the most demanding needs of the surface scientist or materials analyst. It is equipped with a standard Mg/Al source. It has capabilities of XPS, and Auger and can provide surface composition; chemical state of elements at the near surface region and compositional depth profiling via Ar+ sputtering.
Bruker D8 Advance X-ray diffractometer
This system has the para-focusing Bragg-Brentano geometry and parallel beam geometry and three sample stages (rotational stage, compact Eulerian Cradle and reflectometry sample stage). It has multi configurations enabling a variety of applications of identification of crystalline phase of solid or liquid samples, film thickness and roughness, lattice mismatch and relaxation for epitaxial films; thin films grazing incidence diffraction for phase identification of very thin films; texture analysis of orientation identification and residual stress determination of the films.
X-ray Diffraction Facility
There are five automated x-ray sources that are configured to perform 6 different x-ray diffraction experiments: a) theta - 2theta powder diffraction, b) glancing angle diffraction for thin film characterization, c) Laue diffraction, d) Lang topography, e) triple axis high resolution diffractometry, and d) texture analysis.
The DXR Raman Microscope
This Raman microscope has high spatial resolution, confocal depth-profiling, mapping and the ease of sample preparation.
Thermo Nicolet 6700 FTIR Spectrometer
This spectrometer is able to collect spectra in the mid-IR, far-IR and near-IR spectral ranges.
Thermal Analysis Systems
Three Perkin-Elmer TAC7/DX Series systems: (1) Differential Scanning Calorimeter (DSC7); (2) Thermomechanical Analyzer (TMA7); (3) Thermogravimetric Analyzer (TGA7).
Optical Microscopes
Four optical microscopes furnished with a digital camera are available for general surface and microstructure observations: (1) Nikon labophot-2; (2) Nikon Eclipse L150; (3) Nikon Eclipse ME600 and (4) Nikon SMZ 1500.
SEM Sample Preparation Facility
Two sputtering systems: (1) CrC-100 and (2) Hummer VI are available for coating conductive layers on non-conductive samples for SEM observation.
TEM Sample Preparation Facility
  • Two Gatan model 691 precise ion polishing systems (PIPS)
  • One Gatan dual Ion mill polishing system.
  • One Gatan model 656 dimpler grinder.
  • Two low speed diamond saws.
  • One Teckcut 5 cutting machine.

Selected Publications

Selected Papers Benefiting from UTA c2mb

Refereed Journal Papers

  • Two-dimensional Interface Structures of Epitaxial (Ba,Sr)TiO3 film on Miscut (001) MgO, J.C. Jiang, J. He, E.I. Meletis, C. L. Chen, Y. Lin, J. Horwitz, and A. J. Jacobson, Thin Solid Films. (submitted).
  • Twin-coupled Domain Structures in Epitaxial Relaxor Ferroelectric Ba(Zr,Ti)O3 Thin Films on (001) MgO Substrate, J. He, J. C. Jiang, E.I. Meletis, J. Liu, G. Collins and C. L. Chen, A. Bhalla, Philosophical Magazine Letters (submitted).
  • Ferroelectric BaTiO3 Thin Films on Ti Substrate Fabricated Using Pulsed-laser Deposition, J. C. Jiang, J. He, E. I. Meletis, J. Liu, G. Collins, C. L. Chen, B. Lin, V. Giurgiutiu, R.Y.Guo and A. Bhalla, Journal of Nanoscience and Nanoengineering (in press).
  • Tribological Behavior of Nanocrystalline Metals, D.J. Guidry, K. Lian, J.C. Jiang and E.I. Meletis, Journal of Nanoscience and Nanoengineering (in press).
  • Wear Mechanism of Nanocrystalline Metals, Z.Q. Qi, J.C. Jiang and E.I. Meletis, Journal of Nanoscience and Nanotechnology. [invited]
  • Compressive Stresses in Tin/Ti Multilayer Coatings Deposited by Large Area Filtered Arc Deposition, Y.H. Cheng, T. Browne, B. Heckman, J.C. Jiang, E.I. Meletis, C. Bowman and V. Gorokhovsky, J. Appl. Phys. Vol 104 (2008) Article Number: 093502.
  • Epitaxial Growth of Cd1-xSexTe Thin films on Si (100) by Molecular Beam Epitaxy Using Lattice Mismatch Graded Structures, F. Z. Amir, K. Clark, E. Maldonado, W. P. Kirk, J. C. Jiang, J. W. Ager III, K. M. Yu, and W. Walukiewicz, J. Crystal Growth, 310, 1081-1087 (2008).
  • Fabrication of Co Nanostructures in Carbon Films, J.C. Jiang, X. Nie and E.I.Meletis, International Journal of Nanomanufacturing, 2, (2008) 16-23.
  • Fabrication and Thermal Stability of Co Nanopillars in d Diamondlike Carbon Films, J.C. Jiang, F.L. Wang and E.I. Meletis, International Journal of Nanomanufacturing, 2,(2008) 80-98.
  • Highly Epitaxial Ferroelectric (Pb,Sr)TiO3 Thin Films With Extra Large Dielectric Tunability: A Good Candidate for Room Temperature Tunable Microwave Elements, Y. Lin, X. Chen, J. Liu, Z. Yuan, G. Collins, C. L. Chen, J. C. Jiang, E. I. Meletis, C. L. P. Chen, and A. Bhalla, Integrated Ferroelectrics Vol 100 (2008) 1-15 (invited).
  • Integration of Ferroelectric BaTiO3 Thin Films Directly on Ni and Ti Metallic Tapes for Structural Health Monitoring Systems and Energy Harvest Applications, J. Weaver, Z. Yuan, J. Liu, G. Collins, C. L. Chen, J. C. Jiang, J. He, E. I. Meletis, R. Y. Guo, A. Bhalla, B. Lin, V. Giurgiutiu and M. W. Cole, Integrated Ferroelectrics,Vol 100 (2008) 61-71 (invited).
  • Orientation Preferred Structures in BaTiO3 Thin Films on Ni Substrates, J. C. Jiang, E.I. Meletis, Z. Yuan, J. Liu, J. Weaver, C. L. Chen, B. Lin, V. Giurgiutiu, R.Y.Guo, A.S. Bhalla, D. Liu and K. W. White, Journal of Nano Research, Vol. 1, 59-63 (2008).
  • Two-dimensional Modulated Interfacial Structures of Highly Epitaxial Ferromagnetic (La,Ca)MnO3 and Ferroelectric (Pb,Sr)TiO3 Thin Films on (001) MgO, J. C. Jiang, J. He, E.I. Meletis, J. Liu, Z. Yuan, and C. L. Chen, Journal of Nano Research, Vol. 3, 59-66 (2008)..
  • BaTiO3 Thin Films on Metallic Substrates: Fabrication, Microstructure and Property, J.C. Jiang, Z. Yuan, J. Liu, J. Weaver, C.L. Chen, B Lin, V. Giurgiutiu, R.Y. Guo and A. Bhalla, Materials Science and Technology (MS&T) 2007, Electronic and magnetic properties: International Symposium on Dielectric Materials: Design, Preparation and Applications. September 15-20, 2007, Detroit, Michigan, USA. Pp 223-232 (Invited).
  • Correlation between Structural Deformation and Magnetoelectric Response in (1-x) Pb(Zr0.52Ti0.48)O3 - x NiFe1.9Mn0.1O4 Particulate Composites, Rashed Islam, Jiechao Jiang, Shashank Priya, Feiming Bai and Dwight Viehland, Appl. Phys. Lett. 91 (2007) 162905.
  • Effects of N-doping on the Microstructure, Mechanical and Tribological Behavior of Cr-DLC Thin Films, Sunil K. Pal, Jiechao Jiang, and Efstathios I. Meletis, Surf. Coat. Technol., 201, 7917-7923 (2007).
  • Ferroelectric BaTiO3 Thin Films on Ni Metal Tapes for Structural Health Monitoring Applications, Z. Yuan, J. Liu, J. Weaver, C. L. Chen, J. C. Jiang, B. Lin, V. Giurgiutiu, A. Bhalla and R. Y. Guo, Appl. Phys. Lett. 90 (2007) Art No. 202901.
  • Interface Modulated Structure of Highly Epitaxial (Pb,Sr)TiO3 Thin Films on (001) MgO, J.C. Jiang, Z. Yuan, C.L. Chen and E.I. Meletis, Appl. Phys. Lett., 90 (2007) Art. No. 051904.
  • Phase Separation Induced by Oxygen Deficiency in La0.67Ca0.33mno Thin Films, G.Y. Wang, S.W. Liu, T. Wu, X.G. Luo, C.H. Wang, J.C. Jiang, X.H. Chen and C.L. Chen, Solid State Communication Volume 144, Issues 10-11 (2007) 454-459
  • Self-assembled Periodic Nanoporous Network in Multifunctional ZrO2-CeO2-(La0.8Sr0.2)MnO3 Composites, V. Sharma, J.C. Jiang, M. Hossu, A. Koymen and S. Priya, Appl. Phys. Lett., 90 (2007) art. No. 123100

Conference Invited Lectures/Proceedings/Abstracts

  • Application of Plan-view TEM in the Interface Characterization of the Heteroepitaxial Structure, J.C. Jiang, Z. Yuan, C.L. Chen and E. I. Meletis, Materials Science and Technology (MS&T) 2007 Conference and Exhibitor, Electronic and Magnetic properties: Ferroelectrics and Multiferrocis. September 16-20, 2007, Detroit, Michigan, USA. pp 255 (Invited).
  • BaTiO3 Thin Films on Metallic Substrates: Fabrication, Microstructure and Property, J.C. Jiang, Z. Yuan, J. Liu, J. Weaver, C.L. Chen, B Lin, V. Giurgiutiu, R.Y. Guo and A. Bhalla, Materials Science and Technology (MS&T) 2007 Conference and Exhibitor, Electronic and magnetic properties: International Symposium on Dielectric Materials: Design, Preparation and Applications. September 16-20, 2007, Detroit, Michigan, USA. pp 258 (Invited).
  • Two-dimensional Interfacial Structures of Epitaxial Perovskite Structure Thin Films on MgO, J. C. Jiang, J. He, E.I. Meletis and C. L. Chen, Journal of Nano Research, Vol. 3, 59-66 (2008).1st International Conference from Nanoparticles & Nanomaterials to Nanodevices & Nanosystems. June 16-18, 2008, Halkidiki, Greece (Invited).
  • Composite-like Structure in the Epitaxial Relaxor Ferroelectric Ba(Zr,Ti)O3 Thin Films on (001) MgO Substrate, J. He, J. Jiang, E. Meletis, C. Chen and A. Bhalla, Materials Science and Technology (MS&T) 2008 Conference and Exhibitor, Electronic and magnetic properties: Fabrication, Microstructures and Interfacial Properties of Multifunctional Oxide Thin Films: Microstructure and Dielectric Properties of Oxide Films. October 5-9, 2008, Pittsburgh, Pennsylvania, USA, pp261.
  • Dielectric Properties of Ba(Zr,Ti)O3 Thin Films for Tunable Microwave Applications, J. Liu, G. Collins, J. Weaver, C. Chen, J. Jiang, E. I. Meletis and A. Bhalla, Materials Science and Technology (MS&T) 2008 Conference and Exhibitor, Electronic and magnetic properties: Ferroelectrics and Multiferroics: Physical Properties and Nanoscale Phenomena in Ferroelectric, Ferromagnetic, and Magnetoelectric Thin Films and Nanostructures. October 5-9, 2008, Pittsburgh, Pennsylvania, USA, pp164.
  • Fabrication and microstructure of the BaTiO3 thin films on Ti substrate, J. Jiang, J. He, E. Meletis, Z. Yuan, J. Liu, J. Weaver, C. Chen, B. Lin, V. Giurgiutiu, R. Guo, A. Bhalla, Materials Science and Technology (MS&T) 2008 Conference and Exhibitor, Electronic and magnetic properties: Fabrication, Microstructures and Interfacial Properties of Multifunctional Oxide Thin Films: Preparation and Properties of Oxide Films. October 5-9, 2008, Pittsburgh, Pennsylvania, USA, pp200.
  • Ferroelectric BaTiO3 Thin Films on Ni Metal Tapes Using NiO as Buffer Layer, G. Collins, J. Liu, J. Weaver, C. Chen, J. Jiang, E. Meletis, V. Giurgiutiu, R. Guo and A. Bhalla, Materials Science and Technology (MS&T) 2008 Conference and Exhibitor, Electronic and magnetic properties: Ferroelectrics and Multiferroics: Piezoelectric Ceramics and Thin Films. October 5-9, 2008, Pittsburgh, Pennsylvania, USA, pp34.
  • Interfacial Structures of Epitaxial Perovskite Oxide Thin Films on (001) MgO Substrate, J. Jiang, J. He, E. Meletis, J. Liu, Z. Yuan, and C. Chen, Materials Science and Technology (MS&T) 2008 Conference and Exhibitor, Electronic and magnetic properties: Fabrication, Microstructures and Interfacial Properties of Multifunctional Oxide Thin Films: Microstructures, Defects, and Interfaces. October 5-9, 2008, Pittsburgh, Pennsylvania, USA, pp227.
  • Microstructure of Ferroelectric BaTiO3 Thin Films on Ti Substrate, J. He, J. C. Jiang, E. I. Meletis, Z. Yuan, J. Liu, J. Weaver, C. L. Chen, B. Lin, V. Giurgiutiu, R.Y.Guo and A. Bhalla, Proceedings of Microscopy and Microanalysis, Microscopy Society of America, Vol. 14, Supplement 2, pp.346-347, Albuquerque, New Mexico, August 3-7, 2008.
  • Plan-view TEM Study on Interfacial Structure of (La,Ca)MnO3/MgO, J.C. Jiang, J. He, E.I. Meletis, Z. Yuan and C.L. Chen, Proceedings of Microscopy and Microanalysis, Microscopy Society of America, Vol. 14, Supplement 2, pp.232-233, Albuquerque, New Mexico, August 3-7, 2008.
  • Ferroelectric Thin-Film Active Sensor Arrays for Structural Health Monitoring, Bin Lin, Victor Giurgiutiu, Chonglin Chen, Jiechao Jiang, Amar S. Bhalla, Ruyan Guo, SPIE Smart Structures & Materials/NDE 2007, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems,San Diego, CA, 18–22 March 2007, paper # SS07-6529-16