Skip to content. Skip to main navigation.

New Frontiers of Atomic Scale Characterization in the Electron Microscope

January 29, 2013 | 4:00 pm till 5:00 PM
Science Hall Room 101 | Seminar Flyer

Seminar Speaker

James LeBeau

Department of Materials Science and Engineering, North Carolina State


In this talk, Dr. LeBeau will introduce revolving scanning transmission electron microscopy (RevSTEM). The method uses a series of fast-frames. This scan rotation introduces a concomitant change in image distortion that we use to analyze the sample drift rate and direction. LeBeau will provide a theoretical basis for the approach and introduce the projective standard deviation (PSD) to quantify lattice vector angles in atomic resolution images.