January 29, 2013 |
4:00 pm till 5:00 PM
Science Hall Room 101 | Seminar Flyer
Department of Materials Science and Engineering, North Carolina State
In this talk, Dr. LeBeau will introduce revolving scanning transmission electron microscopy (RevSTEM). The method uses a series of fast-frames. This scan rotation introduces a concomitant change in image distortion that we use to analyze the sample drift rate and direction. LeBeau will provide a theoretical basis for the approach and introduce the projective standard deviation (PSD) to quantify lattice vector angles in atomic resolution images.