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UTA Characterization Center for Materials and Biology (CCMB): Capabilities down to Atomic Scale Characterization Usage Policies and Procedures

August 31, 2018 | 11:00 a.m.
NH 203

Seminar Speaker

Dr. Jiechao Jiang

Dr. Jiechao Jiang is a Research Professor in MSE and the facility manager of the CCMB.


The properties and performance of the materials strongly depend on their microstructure. The structural knowledge of these materials becomes essential to pursue new materials and devices with novel properties and outmost performance. Especially nowadays development of high technology requires using small amount of materials with a size down to nanometer scale but possessing ultimate property and performance. Understand the microstructure of the material at atomic scale is therefore a must to develop new materials. In this talk, I will present available capabilities down to atomic scale characterization in Characterization Center for Materials and Biology (CCMB) and instruct the policies and procedures for using the facility. The students who are going to use the facility for their research projects are required to attend this seminar.

UTA’s 5,500-square-foot CCMB is a centralized user facility for comprehensive materials characterization. It houses state-of-the-art instrumentation, and offers comprehensive techniques and capabilities that are crucial to advanced materials research and analysis for both university and industry. The CCMB provides information from the surface structure (morphology/roughness, composition and element chemical state and distribution) to the internal and local microstructure (crystallographic structure, grain size and distribution of nanostructured materials, defects, precipitates, grain boundaries and interfaces, and chemical information) at the atomic level of metal/alloys, ceramics, semiconductors, polymer/plastics, and biological samples in a variety of forms (bulk, coatings/thin films, multilayers, micro/nano patterning structures, nanoparticles, etc.). Instrumentation in the CCMB includes: Dual-beam FIB/FESEM; SEM/EDS/EBSD; AFM; TEM/HRTEM; XRD; XPS/AES; FTIR and Raman; Nano Indenter; Micro-hardness Tester; Thermal Analysis Systems and Sample Preparation Facility.


Dr. Jiechao Jiang is a Research Professor in MSE and the facility manager of the CCMB. Dr. Jiang received his Ph.D. in 1993 from the University of Science and Technology Beijing and the Beijing Laboratory of Electron Microscopy, Chinese Academy of Science. Before Dr. Jiang joined UTA, he has worked at Louisiana State University, University of Michigan (Ann Arbor), University of Marburg & Max-Planck-Institute (Germany), and Stockholm University (Sweden). Dr. Jiang has about thirty years’ experience in the field of electron microscopy and microanalysis. He has extensive expertise of most electron microscope techniques and tremendous experience in surface analysis. Dr. Jiang has published over 140 referred journal articles on the advance materials including semiconductor and ceramic oxide thin films, surface modified materials and coatings, nanostructured materials, minerals and quasicrystals which have been cited by other authors more than 2500 times. Dr. Jiang is frequently invited to present his work in the international conferences. His research projects have been funded by NSF.