
|
UHV linear E-beam source
Quartz Crystal Thickness Monitor
Substrate Holder with the following features:
*accommodates substrates up to 6’’ diameter
*continuous motorized rotation (0-20 RPM) with controller
*radiant heating to 850 °C with quartz halogen lamp for samples up to 4’’, 300 °C for samples 4’’ – 6’’
SUBSTRATE RF BIAS for PRE-CLEANING
Deposition Uniformity: better than +/- 2.5% over a 4” diameter wafer
Base Vacuum: better than or equal to 5.0×10-8 Torr
Pumpdown to 5×10-7 Torr in 30 minutes or less from clean dry and empty after N2 vent
All Deposition and Etching Facilities

