Facility

HP 4061A Test Station

  • Fully-automated with switching controller for current-voltage and capacitance-voltage scans
  • Shielded micromanipulator probe station for ultra low-noise measurements
  • Signatone shielded probe station with temperature-controlled chuck for high temperature scans
  • Vacuum chuck probe station for low-temperature measurements

 


All Characterization Facilities

Dimension 5000 AFM
Electrical Test Station
HP 4061A Test Station
KLA-Tencor Alpha-Step IQ Profilometer
KLA-TENCOR PROFILOMETER
Nomarski Microscope
OCEAN OPTICS NC-UV-VIS REFLECTOMETER
Zeiss LSM 5 Pascal Confocal Microscope
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