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  Faculty Profile  Faculty ProfileLast Modified Time: 03:06:19 PM Tue, 25 Aug 2009 
Dr. Zeynep  Celik-Butler
 Contact Information
Dr. Zeynep Celik-Butler Associated Profiles 
Professor & Director-Nanotechnology, Professor-Electrical Engineering
 
Contact address   Arlington, TX 76019     Office LocationMail Box: 19072, Nanofab Center 
Email  zbutler@uta.edu    Contact Number 817-272-1309    Fax No: 817-272-7458    Web Link Web Link   
Keywords Noise and reliability in electronic devices, Hish-k dielectrics, Sensors and detectors on flexible substrates for "smart skin", Wafer-level packaging   
 Professional Preparation
 DegreeMajorInstitutionYear
 Ph.D.electrical engineeringUniversity of Rochester1987
 M.S.electrical engineeringUniversity of Rochester1984
 B.S.electrical engineering and physicsBogaziçi University, Istanbul, Turkey1982
 Research and Expertise
Uncooled Infrared Detectors
 
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A radiation detector is a device that produces an output signal, which depends on the amount of radiation hitting the active region of the detector. In general, infrared (IR) sensors can be classified as thermal or photon type of detectors. Photon type detectors such as photovoltaic or photoconductive sensors operate on the principles of direct electron - photon interaction. They provide superior sensitivity and response speed. However, photon detectors typically require costly cryogenic operation to minimize the noise sources to obtain the high relative sensitivity. On the other hand, thermal detectors convert incident radiation into heat, thereby raising the temperature of the detector element. This change in temperature is then converted to an electrical signal that can be amplified and displayed. Thermal detectors are capable of responding to a wide range of wavelengths without appreciable variation in responsivity. Thermal detectors display high sensitivity at room temperature to permit imaging and radiometry applications.

Noise and Reliability in Electronic Devices
 
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As the devices scale down, even though the absolute noise magnitude gets smaller, since the voltages also scale down, the signal-to-noise ratio decreases. Noise models developed for large area devices based on the large-number-electron averaging theories break down. In addition, in sub-micron devices, as the device dimensions approach electron mean-free path, quantum effects start to play an important role. Since noise has important implications on the reliability and performance of the device, beyond a certain limit of scaling down, with existing models, it becomes impossible to predict the noise performance of an individual transistor, specifically a MOSFET. The lack of accurate models leads the process and circuit designer either to adapt large area-transistor models with high errors or to use a trial-and-error method leading to significant waste of valuable time. As the Semiconductor Research Corporation (SRC) has correctly concluded that there is an urgent need to measure, analyze, and model the noise characteristics of next generation sub-micron transistors.

Superconductive Devices
 
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The primary objective of this project was to fabricate YBa2Cu3O7-x thin-film microbridges for the purpose of millimeter-wave detection and mixing. Reactive sputtering and hot oxygen jet sputter fabrication techniques were employed to produce high-quality YBa2Cu3O7-x thin-films. After the initial investigation of the composition, microstructure and the DC electrical properties, these films were patterned into variable thickness microbridges for millimeter-wave detection and mixing applications. Special emphasis was given to the repeatability of the fabrication process as it applied to the transition temperature, critical current, and noise properties.

Smart Skin
 
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toggle toggle Publications
  Category    Type  Publications per page   1  2 3 4 
  YearPublication  Type
2003
Published
"Model for Random Telegraph Signals in Sub-Micron MOSFETs," N. V. Amarasinghe, Z. Çelik-Butler, F. Wang and A. Zlotnicka, Solid State Electronics, vol. 47, pp. 1443-1449 (2003).
Peer reviewed
2002
Published
Uncooled Multi-Mirror Broadband Infrared Microbolometers, M. Almasri, Z. Çelik-Butler, D. P. Butler, Alp Yaradanakul, Ali Yildiz, IEEE/ASME Journal of Microelectromechanical Systems, vol. 11, pp. 528, 535, 2002.
Category: Infrared Microsensors and MEMS
Peer reviewed
2002
Published
"Random Telegraph Signals in Deep Sub-Micron MOSFETs, Z. Çelik-Butler and N. V. Amarasinghe, Invited book chapter in Noise and Fluctuation Control in Electronic Devices, 2002, Editor: Alexander Balandin, ISBN: 1-58883-005-5.
Category: Noise and Reliability in Electro
Book chapters
2002
Published
Temperature Dependence of 1/f Noise in Polysilicon Emitter Bipolar Transistors, E. Zhao, Z. Çelik-Butler, F. Thiel and R. Dutta, IEEE Transactions on Electron Devices, vol. 49, 2002.
Category: Noise and Reliability in Electro
Peer reviewed
2002
Published
Low-Frequency Noise In Deep-Submicron Metal-Oxide Semiconductor Field-Effect Transistors, Z. Çelik-Butler, INVITED Special Topics on Noise in Semiconductors, IEE Proceedings on Circuits, Devices and Systems, vol. 149, pp. 23, 31, 2002.
Category: Noise and Reliability in Electro
Conference paper
 Affiliations
Post-Doctoral Associates:
Vladimir Leonov, 1998 - 2000, Petr Vasina, 1998, Catherine Barros, 1997-1998, Lin Ren, 1997
 Thesis Supervised
M.S.
Agha Jahanzeb, John E. Gray, Fang Wang
Ph.D.
Sharif Alamgir, Wiyi Yang, Jiang-Lin Wang, Wenmu He, Pao Chuan Shan, Nudiatha Vibhavie Amarasinghe, Alparslan Yardanakul, Ali Yildiz
 Appointments
DurationRankDepartment / SchoolCollege / OfficeUniversity / Company
2002-PresentProfessorDepartment of NanotechnologyCollege of EngineeringUniversity of Texas at Arlington
1996-1999Assistant Dean of Graduate Studies and ResearchElectrical Engineering Southern Methodist University
1993-1996Associate ProfessorElectrical Engineering Southern Methodist University
1990-1993J. Lindsay Embrey Trustee Assistant ProfessorshipElectrical Engineering Southern Methodist University
1987-1993Assistant ProfessorElectrical Engineering Southern Methodist University
 Synergistic Activities
Membership
1988, 1989 IEEE-IEDM's and Annual Symposia on Electronic Materials, Processing and Characterization (1989 - 1992) and International Conference on Noise in Physical Systems and 1/f Fluctuations (1993, 1999, 2001, 2003); General Chair of TEXMEMS II Workshop

 Support
 DurationTitleSponsorAmountStatus
9/1/2001-8/31/2002Broad-Band Pyroelectric IR DetectorsNASA-Langley$261,000Previous
8/1/2001-8/31/2004Measurements and Modeling of Noise in Advanced BipolarTexas Instruments SRC$210,000.Previous
8/1/2001-7/31/2004Micromachined Infrared Sensors on Flexible SubstratesNational Science Foundation,$300,000.Previous
3/1/2001-12/31/2002Noise Performance and Modeling of Bipolar TransistorsLegerity$47,263Previous
10/1/2001-3/31/2002Small Grants for Exploratory ResearchNational Science Foundation$70,000.Current
1/1/2002-12/31/2003Compact, Scalable Computer Models for Noise in Advanced CMOSTexas Higher Education Coordinating Board,$148,290Previous
 News Articles
Married to Their Research and to Each Other
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Detect and Defend,"
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"Professors' Project Gives NASA a 'FIRST',"
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 Teaching
 
EE 5344 - Introduction to MEMS
Fall 2009
Download Syllabus (69.5KB. This syllabus was uploaded Tuesday 25th, August 2009 03:06:19 PM and is subject to change.)
Contact Information
Nanofab Center
Phone: 817-272-1309  Email: zbutler@uta.edu


For the Official List of Courses for registration, please visit MyMav - Schedule of Classes
 Additional Information
Awards and Honors
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1998 - present IEEE-Electron Devices Society Distinguished Lecturer, March 2001 SMU Graduate Student Council Outstanding EE Faculty Award for 2000-2001, May 1997 Sigma Xi Research Award for SMU Chapter, April 1997 SMU Graduate Student Council Outstanding EE Faculty Award for 1996-1997, March 1997 IEEE-Electron Devices Society, Dallas Section Outstanding Service Award

Sponsors and Collaborators
Texas Higher Education Coordinating Board - ARP/ATP National Science Foundation Army Research Office. NASA Semiconductor Research Corporation DARPA Raytheon Company Texas Instruments Inc. Motorola Inc. Legerity Corporation Metroplex Research Consortium for Electronic Devices and Materials (MRCEDM)

 
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