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GCMS-QP2010 Ultra

There is increasing public interest in the analysis of trace compounds that contribute to environmental pollution, affect human health and in research related to novel compounds. Reducing running costs and lessening the impact on the environment by increasing analytical efficiency and decreasing power consumption are universal goals. The GCMS-QP2010 Ultra was developed by engineers who accepted the challenge to meet these needs.


Scan Speed and Sensitivity

The Shimadzu single quadrupole GCMS-QP2010 Ultra gas chromatograph-mass spectrometer offers the highest performance in its class. The GCMS-QP2010 Ultra utilizes patented Advanced Scanning Speed Protocol (ASSP™) technology, allowing high-speed scanning at 20,000 u/second without sensitivity loss or spectral distortion, and is ideally suited for fast-GC/MS and Comprehensive GC/MS (GC x GC/MS). The precision-designed quadrupole mass filter is able to obtain accurate mass assignments across the entire mass range, and is equipped with a pre-filter to reduce the influence of contamination on the main filter. The front-access ion source simplifies and streamlines routine maintenance tasks.

High-Efficiency Ion Source

Provides the foundation of an ion generation and transmission system which efficiently creates, then delivers, ions to the dectector, resulting in a GC-MS with the highest sensitivity specification in its class.

High-Capacity Differential Vacuum System

A high-capacity dual-inlet turbomolecular pump with a differential vacuum system maintains dual zone vaccum and enables the column flow rate to be set to a maximum of 15 mL/min.
Twin Line column system allows two capillary columns to besimultaneously installed into the mass analyzer without loss of sensitivity.

High-Speed Scanning Control(Advanced Scanning Speed Protocol, ASSP™)

The rod bias voltage is automatically optimized during ultrahigh-speed data acquisition, thereby minimizing the drop in sensitivity that would otherwise occur above 10,000 u/sec. The GCMS-QP2010 Ultra achieves a level of sensitivity better than five times that of older instruments, and is particularly effective for scan measurement in applications related to fast-GC/MS and Comprehensive GC/MS (GC×GC/MS). (Patent: US6610979)