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With enhanced sensitivity and selectivity, triple quadrupole GC/MS/MS is the analytical technique of choice for a wide range of applications, from food safety and environmental monitoring to clinical research and forensics. Components that cannot be analyzed by conventional scan or SIM modes are easily identified and quantified at trace levels in the presence of complex matrices using the Multiple Reaction Monitoring (MRM) mode. The fast Scan/MRM analysis mode expands this capability to include simultaneous acquisition of a full scan spectrum for identification of unknowns along with the targeted compounds. As the only GC/MS/MS capable of running all triple quad operational modes and combination of modes without sacrificing sensitivity or accuracy, Shimadzu’s GCMS-TQ8030 elevates this technique to a new level of performance.


High-Sensitivity Ion Source

The effect of the filament’s electric potential on the ion source is reduced by placing more distance between the filament and ion source box. In addition, a shield blocks out radiant heat generated from the filament to ensure the ion source box temperature remains uniform. Since this prevents any active spots within the ion source, it provides higher sensitivity for analysis. (Patent: US7939810)

High-Efficiency Collision Cell UFsweeper®

Shimadzu's proprietary UFsweeper® technology achieves high-speed MRM analysis at speeds up to 600 trans/sec. It efficiently sweeps residual ions from the collision cell to provide high-efficiency CID and fast ion transport. Rapid ion removal minimizes cross-talk and enables trace analysis (patent pending). Enables stable analysis with a minimal drop in sensitivity, even if MRM is set at a high speed. This function is also available in a wide variety of other measurement modes.

Overdrive Lenses (Noise Elimination Technology)

Two lenses (overdrive lenses) positioned in front of the electron multiplier reduce random noise from helium, high-speed electrons, or other factors, and improve the S/N ratio. Applying voltage to the lenses improves the S/N level by reducing noise components near the lenses and focusing the ions that pass through the mass filter. (Patent: US6737644)

High-Speed Scanning Control (Advanced Scanning Speed Protocol, ASSP™)

Achieves scan speeds of 20,000 u/sec. The rod bias voltage is dynamically optimized during ultrahigh-speed data acquisition, thereby minimizing the drop in sensitivity that would otherwise occur above 10,000 u/sec. This is necessary for maintaining sensitivity at high scan speeds and acquiring superior mass spectra when performing product ion scans or simultaneous scan and MRM measurement in the scan/MRM mode. (Patent: US6610979)
By accelerating ions dynamically during high speed scanning, any drop in sensitivity due to increasing the scan speed is minimized while still obtaining high quality mass spectra.