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MSE Adds SEM Equipment

Thursday, June 26, 2014

FEI Strata 400
Strata 400 FE-SEM with dual-beam FIB

Two new pieces of high-technology equipment (valued at more than $1 million) in the Materials Characterization Facility will advance state-of-the-art research on campus.

UTA recently obtained a Hitachi S-4800 field emission scanning electron microscope (FE SEM) with a backscattering electron detector and a Strata 400 FE-SEM with dual-beam focused ion beam (FIB) technology.

The Hitachi machine allows researchers to view fine surface detail. It is an ultra-high-resolution SEM (sub-nanometer resolution) capable of handling large specimens of a variety of sample types such as semiconductor cross-sections, powders, biological thin sections, and nano particles.

Hitachi S4800
Hitachi S-4800 FE SEM

The Strata machine can be used for structural analysis, as well as material and defect analysis. FIBs are often used in the semiconductor industry or to etch or pattern surfaces.

“These new, state-of-the-art materials characterization capabilities will be available to UTA faculty and students providing new education and research opportunities especially in nanoscience and nanotechnology,” said MSE Chair Stathis Meletis.