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MSE Seminar: CCMB Usage Policies and Procedures

Friday, September 8, 2017, 11:00 AM - 12:30 PM
Nedderman Hall Room 229

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Jiechao Jiang, Ph.D.
Research Professor, CCMB Manager
UTA

Abstract
UTA’s 5,500-square-foot Characterization Center for Materials and Biology (CCMB) is a centralized user facility for comprehensive materials characterization. It houses state-of-the-art instrumentation, and offers comprehensive techniques and capabilities that are crucial to advanced materials research and analysis for both university and industry. The CCMB provides information from the surface structure (morphology/roughness, composition and element chemical state and distribution) to the internal and local microstructure (crystallographic structure, grain size and distribution of nanostructured materials, defects, precipitates, grain boundaries and interfaces, and chemical information) at the atomic level of metal/alloys, ceramics, semiconductors, polymer/plastics, and biological samples in a variety of forms (bulk, coatings/thin films, multi-layers, micro/nano patterning structures, nanoparticles, etc.). Instrumentation in the CCMB includes: Dual-beam FIB/FESEM; SEM/EDS/EBSD; AFM; TEM/HRTEM; XRD; XPS/AES; FTIR and Raman; Nano Indenter; Micro-hardness Tester; Thermal Analysis Systems and Sample Preparation Facility. In this seminar, Dr. Jiang will instruct the policies and procedures for using CCMB and the students who are going to use CCMB for their research projects are required to attend this seminar.

Bio
Jiechao JiangJiechao Jiang is a research professor in the Materials Science and Engineering Department and the facility manager of the CCMB. He received his Ph.D. in 1993 from the University of Science and Technology Beijing and the Beijing Laboratory of Electron Microscopy, Chinese Academy of Science. Before joining UTA, he worked at Louisiana State University, the University of Michigan, University of Marburg & Max-Planck-Institute, and Stockholm University. Jiang has about 30 years’ experience in the field of electron microscopy and microanalysis. He has extensive expertise of most electron microscope techniques and tremendous experience in surface analysis. 

Jiang has published more than 140 referred journal articles on the advance materials including semiconductor and ceramic oxide thin films, surface modified materials and coatings, nanostructured materials, minerals and quasicrystals which have been cited by other authors more than 2,500 times. He is frequently invited to present his work in international conferences, and his research projects have been funded by NSF.

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